Phone number
+38 044 333 91 39
Email
kontakt@novations.ua
UA
RU
EN
CN
MENU
MENU
DOCUMENT ANALYSIS AND
RESTORATION OF FINGERPRINTS
Document analysis
VSC systems for document examination
Eye-D® express analysis system
PD2000 express analysis system
ESDA system for visualisation of depressed writing
VSC QC1 system for quick passport verification
Physical evidence analysis
Foram3 Raman Spectrometer
ECCO system for elemental analysis
FFTA research complex
Analysis of the fingerprints
DCS 5 system for fingerprints detection
Crime-lite Imager system
Climate systems of MVC series
FORM ANALYSIS AND
PARTICLE SIZE
Laser particle size analysers
Laser diffraction analyser Bettersizer 2600
Particle size analyser Bettersizer ST
Particle size and shape analyser Bettersizer S3/S3 Plus
On-line particle size analyser BT-Online1
Powder properties analysers
PowderPro A1 Automatic powder analyser
PowderPro M1 Manual powder analyser
METHODS OF ANALYSIS
Electrophoretic scattering
Dynamic light scattering
Laser diffraction
Static light scattering
USAGE
On-line control of size of powders, suspensions and emulsions during manufacturing
Ground analysis (granulometric analysis)
Analysis of stability of colloids, suspensions an emulsions
Determination of size and quantity of nano-particles, colloids, lilomes and exosomes
Determination of particle size of sprays, aerosols, inhalers
Determination of emulsion size
Determination of size, shape and chemical composition of powders and suspensions
Branching and conformation
Zeta-potential/surface charge of proteins
Studying of protein binding and conjugation
Stability, agglomeration and oligomerization
Structure and conformation
Molecular mass distribution
Absolute molecular mass and size of the molecules
IR AND RAMAN
IDENTIFICATION OF MATERIALS
Analysers for raw materials and finished product
Raman analysers TruScan RM/GP
Analyser TruScan GP
Analyser TruScan RM
Analysers for identification of explosives and narcotics
Gemini analyser
FirstDefener analyser
TruDefender analyser
TruNarc analyser
IR-SPECTROMETERS MICRONIR
microNIR Pro 1700 analyser
microNIR Onsite-W analyser
PROCESSING IR-SPECTROMETERS
microNIR PAT-U analyser
microNIR PAT W spectrometer
METHODS OF ANALYSIS
Raman Spectroscopy for carbonate minerals identification
IR-spectroscopy
FTIR-spectroscopy
USAGE
Usage of IR-spectroscopy for polymer materials studying
Custom and border control, aerial security
Identification of unknown and explosive substances, narcotics, precursors
Determination of quality parameters of input raw materials and finished product in agricultural and food industry
On-line monitoring of processes
Quality control of finished product
Analysis of individual substances and mixtures
Detection of counterfeit product
Input control of raw materials quality
Mass
spectrometry
Systems of mass spectrometry
Mass spectrometers with triple quadrupole
Mass spectrometers Triple Quard 4500
Mass spectrometers Triple Quard 5500+
Mass spectrometers Triple Quard 6500+
TOF/TOF systems
QTOF mass spectrometers
TripleTOF mass spectrometers
X500 QTOF mass spectrometers
QTRAP - mass spectrometers
Mass spectrometer with ion trap QTRAP4500
Mass spectrometry system QTRAP 6500+
Software
MASS SPECTROMETRY GEL LEAK DETECTOR
PHD-4 Agilent Technologies portable leak detector
Gel leak detectors of Agilent Technologies series
Sets of reagents
Electronic
microscopy
Raster electronic microscopes FEI
Scanning electronic microscopes Apreo™ SEM
Scanning electronic microscopes Quattro ESEM
Scanning electronic microscopes Verios™ XHR SEM
Scanning electronic microscopes Prisma™ E SEM
Antireflective electronic microscopes FEI
Antireflective electronic microscopes Talos TEM
Antireflective electronic microscopes Themis TEM
ELECTRONIC ION MICROSCOPES (TWO-BEAM SYSTEMS)
Helios NanoLab Two-beam systems
Scios electronic ion microscopes
Oxford Instruments analytical systems
System of EDS detection manufactured by Oxford Instruments
System of EBSD detection manufactured by Oxford Instruments
System of WDS detection manufactured by Oxford Instruments
Software Oxford Instruments
AMETEK analytical systems
System of EDS detection manufactured by AMETEK
System of EBSD detection manufactured by AMETEK
System of WDS detection manufactured by AMETEK
Software AMETEK
PAT implementation
and services
PAT Implementation
MEASURING OF PARTICLES SHARE IN THE AIR AND LIQUIDS
Measuring of particles share in liquids
Categorization of clean premises
Qualification and categorization of the air of clean premises in accordance with ISO
On-line monitoring systems in clean premises
On-line monitoring systems in clean premises
Development and validation of analytical research methods
Physico-chemical research
Granulometric analysis
Equipment repair and maintenance
Equipment calibration
Vacuum
Головна Сторінка
»
General
DOCUMENT ANALYSIS AND RESTORATION OF FINGERPRINTS
FORM ANALYSIS AND
PARTICLE SIZE
IR AND RAMAN
IDENTIFICATION OF MATERIALS
Mass
spectrometry
Electronic
microscopy
PAT implementation
and services
Measuring of particles share in liquids
On-line monitoring systems in clean premises
Development and validation of analytical research methods
Physico-chemical research
Equipment repair and maintenance
Equipment calibration
Our contacts
EN
(
EN
)
UA
(
UA
)
RU
(
RU
)
CN
(
CN
)
We use cookies to help the website function, to ensure we give you the best experience, and to show relevant advertisements tailored to your interests. Click ‘Accept cookies' to continue using the website.
Ok
