Electronic microscopy

Quick, efficient and universal electronic microscopes:

Raster or scanning (SEM);
Antireflective or transmission (ТЕМ)

Manufactured by FEI(Thermo Scientific) company are recognized worldwide as leading systems for studying surface relief, structure and composition of an object with nanometric separation. To observe an enlarged image through the electronic microscope a focused electron beam is directed on the observed object. Methods of observation depend on detectors location and allow to receive various information concerning the object: Observation of rays passing through the object, analysis of reflected rays in the course of registration of secondary electrons or x-rays. The method of registration an software with appropriate detector are chosen in accordance with the task at hand: